Paper
8 October 2004 Integrated noise model for STJ direct detectors
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Abstract
We present a method for simulating the performance of millimetre-wave and submillimetre-wave STJ direct detectors when combined with commercially available op-amp based readout circuits. We employ full nonlinear modelling, together with frequency-domain analysis, to determine the responsivity, and then we use this responsivity, in conjunction with a detailed noise model, to calculate the NEP. By modelling the saturation of these devices, we are also able to calculate the dynamic range. Our method is capable of simulating a wide range of devices and takes into account the RF matching circuits. Using this approach, we have explored the effect of cooling STJs to different temperatures, and the effect of changing the frequency of operation. To achieve the best noise performance, the energy gap should be tailored to suit the operating frequency, and the device should be biased at a low voltage. We have performed detailed simulations to show that by using TaAl devices, and suitably chosen op-amp feedback components, an NEP of 6.0x10-18 W/√Hz and dynamic range of 80 dB should be possible at 150 GHz: these conclusions draw on results already known from optical photon-counting experiments.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edward S. Campbell, Stafford Withington, and David J. Goldie "Integrated noise model for STJ direct detectors", Proc. SPIE 5498, Millimeter and Submillimeter Detectors for Astronomy II, (8 October 2004); https://doi.org/10.1117/12.550341
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KEYWORDS
Sensors

Video

Resistance

Capacitance

Aluminum

Modeling

Integrated modeling

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