Attenuated Total Reflectance (ATR) And Reflection Absorption Infrared (RAMS) Spectroscopic Analysis Of Thin Films

Richard W. Duerst; William A. Peters; W. E. Breneman; G. A. Kohler

doi:10.1117/12.970942

20 December 1985 Attenuated Total Reflectance (ATR) And Reflection Absorption Infrared (RAMS) Spectroscopic Analysis Of Thin Films

Richard W. Duerst, William A. Peters, W. E. Breneman, G. A. Kohler

Author Affiliations +

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970942
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

Attenuated total reflectance infrared spectroscopic (ATR-IR) analysis (also termed in ternal reflectance spectroscopy or Ins) of thin films coated on an internal reflectance element (IRE) should be considered a viable alternative to the reflection absorption infra-red spectroscopic (RAIRS) method, where thin films are coated an mirror surfaces, preliminary results have shown that reasonable, if not superior, spectra can be obtained for films as thin as 25 A (approximately a monolayer) coated on a germanium crystal.

Citation Download Citation

Richard W. Duerst, William A. Peters, W. E. Breneman, and G. A. Kohler "Attenuated Total Reflectance (ATR) And Reflection Absorption Infrared (RAMS) Spectroscopic Analysis Of Thin Films", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970942

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