A polarimeter using two photoelastic modulators

Baoliang Wang; Richard R. Rockwell; Andy Leadbetter

doi:10.1117/12.559944

2 August 2004 A polarimeter using two photoelastic modulators

Baoliang Wang, Richard R. Rockwell, Andy Leadbetter

Proceedings Volume 5531, Interferometry XII: Techniques and Analysis; (2004) https://doi.org/10.1117/12.559944
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

We describe in this paper a special polarimeter for measuring linear birefringence in transparent optical samples. The polarimeter employs two photoelastic modulators that operate at different frequencies (50 KHz and 60 KHz). The resulting electronic signal at the detector is processed using two methods: demodulation by lock-in amplifiers or using Fourier analysis of a digitized waveform. We compare the results obtained by using the two signal processing methods in this special polarimeter and discuss how each method benefits selected applications.

Citation Download Citation

Baoliang Wang, Richard R. Rockwell, and Andy Leadbetter "A polarimeter using two photoelastic modulators", Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); https://doi.org/10.1117/12.559944

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