An accumulative x-ray streak camera with 280-fs resolution

Mahendra Man Shakya; Zenghu Chang

doi:10.1117/12.560526

10 November 2004 An accumulative x-ray streak camera with 280-fs resolution

Mahendra Man Shakya, Zenghu Chang

Proceedings Volume 5534, Fourth Generation X-Ray Sources and Optics II; (2004) https://doi.org/10.1117/12.560526
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

We demonstrated a significant improvement in the resolution of the x-ray streak camera by reducing the electron beam size in the deflection plates. This was accomplished by adding a slit in front of the focusing lens and the deflection plates. The temporal resolution reached 280 fs when the slit width was 5 mm. The camera was operated in an accumulative mode and tested by using a 25 fs laser with 2 kHz repetition rate and 1-2% RMS pulse energy stability. We conclude that deflection aberrations, which limit the resolution of the camera, can be appreciably reduced by eliminating the wide-angle electrons.

Citation Download Citation

Mahendra Man Shakya and Zenghu Chang "An accumulative x-ray streak camera with 280-fs resolution", Proc. SPIE 5534, Fourth Generation X-Ray Sources and Optics II, (10 November 2004); https://doi.org/10.1117/12.560526

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available