CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 5558 > Article
Paper
2 November 2004 Automatic selection of edge detector parameters based on spatial and statistical measures
Raz Koresh, Yitzhak Yitzhaky
Author Affiliations +
Proceedings Volume 5558, Applications of Digital Image Processing XXVII; (2004) https://doi.org/10.1117/12.560586
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States
Abstract
The basic and widely used operation of edge detection in an image usually requires a prior step of setting the edge detector parameters (thresholds, blurring extent etc.). In real-world images this step is usually done subjectively by human observers. Finding the best detector parameters automatically is a problematic challenge because no absolute ground truth exists when real-world images are considered. However, the advantage of automatic processing over manual operations done by humans motivates the development of automatic detector parameter selection which will produce results agreeable by human observers. In this work we propose an automatic method for detector parameter selection which considers both, statistical correspondence of detection results produced from different detector parameters, and spatial correspondence between detected edge points, represented as saliency values. The method improves a recently developed technique that employs only statistical correspondence of detection results, and depends on the initial range of possible parameters. By incorporating saliency values in the statistical analysis, the detector parameters adaptively converge to best values. Automatic edge detection results show considerable improvement of the purely statistical method when a wrong initial parameter range is selected.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Raz Koresh and Yitzhak Yitzhaky "Automatic selection of edge detector parameters based on spatial and statistical measures", Proc. SPIE 5558, Applications of Digital Image Processing XXVII, (2 November 2004); https://doi.org/10.1117/12.560586
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 9 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors
Edge detection
Detector development
Probability theory
Statistical analysis
Statistical methods
Detection and tracking algorithms
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top