Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction

Garth J. Williams; Mark A. Pfeifer; Ivan A. Vartaniants; Ian K. Robinson

doi:10.1117/12.565062

22 October 2004 Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction

Garth J. Williams, Mark A. Pfeifer, Ivan A. Vartaniants, Ian K. Robinson

Proceedings Volume 5562, Image Reconstruction from Incomplete Data III; (2004) https://doi.org/10.1117/12.565062
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

The penetrating nature and atomic-scale wavelength of X-ray radiation makes the possibility of an X-ray microscope a very exciting prospect. Unfortunately, existing X-ray optics are far less efficient than their visible light counterparts. An attractive alternative to optics is computational inversion of the far-field coherent X-ray diffraction (CXD), which can be measured using modern X-ray sources. Thus we seek to defeat the so-called phase problem by iteratively seeking a set of phases consistent with the CXD measurement and some physical real-space constraints. We have found the behavior of fitting algorithms to be qualitatively different for simulated diffraction patterns and measured coherent X-ray intensity patterns. We will compare the convergence of the inversion of CXD patterns from simply shaped metal crystals with simulation.

Citation Download Citation

Garth J. Williams, Mark A. Pfeifer, Ivan A. Vartaniants, and Ian K. Robinson "Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction", Proc. SPIE 5562, Image Reconstruction from Incomplete Data III, (22 October 2004); https://doi.org/10.1117/12.565062

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