Paper
30 November 2004 Remote measurement of the plume shape of aircraft exhausts at airports by passive FTIR spectrometry
Klaus Schafer, Carsten Jahn, Selina Utzig, Edgar Flores-Jardines, Roland Harig, Peter Rusch
Author Affiliations +
Proceedings Volume 5571, Remote Sensing of Clouds and the Atmosphere IX; (2004) https://doi.org/10.1117/12.565609
Event: Remote Sensing, 2004, Maspalomas, Canary Islands, Spain
Abstract
Information about the interaction between the exhaust plume of an aircraft jet engine and ambient air is required for the application of small-scale chemistry-transport models to investigate airport air quality. This interaction is not well understood. In order to study the interaction, spatial information about the plume is required. FTIR emission spectroscopy may be applied to analyze the aircraft exhausts. In order to characterize the plumes spatially, a scanning imaging FTIR system (SIGIS) has been improved. SIGIS is comprised of an interferometer (Bruker OPAG), an azimuth-elevation-scanning mirror, a data acquisition and control system with digital signal processors (DSP), an infrared camera and a personal computer. With this instrumentation it is possible to visualise the plume and to obtain information about the temperature distribution within the plume. Measurements are performed at low spectral resolution, because the dynamic environment of these measurements limits the measurement time to about 2 minutes. Measurements of the plume shapes of an APU and of main engines were performed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Klaus Schafer, Carsten Jahn, Selina Utzig, Edgar Flores-Jardines, Roland Harig, and Peter Rusch "Remote measurement of the plume shape of aircraft exhausts at airports by passive FTIR spectrometry", Proc. SPIE 5571, Remote Sensing of Clouds and the Atmosphere IX, (30 November 2004); https://doi.org/10.1117/12.565609
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Cited by 5 scholarly publications.
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KEYWORDS
Digital signal processing

FT-IR spectroscopy

Infrared cameras

Absorption

Imaging systems

Spectroscopy

Spectral resolution

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