Paper
10 January 2005 Preparation of homogeneous ZrO2 films
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Proceedings Volume 5623, Passive Components and Fiber-based Devices; (2005) https://doi.org/10.1117/12.571035
Event: Asia-Pacific Optical Communications, 2004, Beijing, China
Abstract
Zirconium oxide films were prepared with and without ion beam assisted deposition (IBAD) by an electron beam. The effects of Ar-ion bombardment on the optical inhomogeneity of ZrO2 films deposited at room temperature were investigated. The results show that all samples are amorphous, and the refractive index of sample A without IBAD randomly changed with the film thickness, while the relative inhomogeneity of samples B, C, D with IBAD nearly zero. It was found that the energy of depositing molecule or atom had an important effect on the optical inhomogeneity of films, and the optical inhomogeneity of amorphous ZrO2 films could be improved by IBAD.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dawei Zhang, Meiqiong Zhan, Weidong Gao, Shuzhen Shang, Yingjian Wang, Jianda Shao, and Zhengxiu Fan "Preparation of homogeneous ZrO2 films", Proc. SPIE 5623, Passive Components and Fiber-based Devices, (10 January 2005); https://doi.org/10.1117/12.571035
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KEYWORDS
Chemical species

Refractive index

Molecules

Ions

Ion beams

Crystals

Electron beams

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