Paper
31 January 2005 Negative refraction in semiconductor photonic crystals
M. Qiu, Z. C. Ruan, A. Berrier, S. S. Xiao, M. Mulot, M. Swillo, S. Anand, S. He, L. Thylen
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Abstract
The coupling efficiency between external plane waves and the Bloch waves in photonic crystals are investigated. It is found that the coupling coefficient is highly angular dependent even for an interface between air n=1 and a photonic crystal with effective index -1. It is also shown that, for point imaging by a photonic crystal slab owing to the negative refraction, the influence of the surface termination to the transmission and the imaging quality is significant. Finally, we present results demonstrating experimentally negative refraction in a two-dimensional photonic crystal.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Qiu, Z. C. Ruan, A. Berrier, S. S. Xiao, M. Mulot, M. Swillo, S. Anand, S. He, and L. Thylen "Negative refraction in semiconductor photonic crystals", Proc. SPIE 5624, Semiconductor and Organic Optoelectronic Materials and Devices, (31 January 2005); https://doi.org/10.1117/12.576253
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KEYWORDS
Photonic crystals

Negative refraction

Interfaces

Waveguides

Finite-difference time-domain method

Imaging systems

Semiconductors

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