Paper
14 February 2005 Laser metrology in the micro-arcsecond metrology testbed
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Abstract
The Space Interferometer Mission (SIM), scheduled for launch in 2009, is a space-born visible light stellar interferometer capable of micro-arcsecond-level astrometry. The Micro-Arcsecond Metrology testbed (MAM) is the ground-based testbed that incorporates all the functionalities of SIM minus the telescope, for mission-enabling technology development and verification. MAM employs a laser heterodyne metrology system using the Sub-Aperture Vertex-to-Vertex (SAVV) concept. In this paper, we describe the development and modification of the SAVV metrology launchers and the metrology instrument electronics, precision alignments and pointing control, locating cyclic error sources in the MAM testbed and methods to mitigate the cyclic errors, as well as the performance under the MAM performance metrics.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xin An, David S. Marx, Renaud Goullioud, and Feng Zhao "Laser metrology in the micro-arcsecond metrology testbed", Proc. SPIE 5634, Advanced Sensor Systems and Applications II, (14 February 2005); https://doi.org/10.1117/12.580030
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Cited by 2 scholarly publications.
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KEYWORDS
Metrology

Interferometers

Laser metrology

Heterodyning

Stars

Mirrors

Sensors

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