Paper
9 February 2005 Influence of probe tip size and incident light polarization on resolution in near-field scanning optical microscopy
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Abstract
Using probe-sample interaction equations based on the dipole-self-consistent field theory, we studied influence of the probe tip size on resolution in near-field scanning optical microscopic system for different undulate protuberance size of the sample surface and distance from the probe to the sample surface. These parameters in the NSOM were all normalized by the probe tip size in our numerical calculation, consequently a new definition expression of NSOMs resolution was suggested. Furthermore we calculated and analyzed polarization influence of the incident light on the resolution. Using probe tip size to normalize another parameter in the calculation and analysis causes the some succinctness conclusions.
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Guiying Wang, Qinghua Wu, and Zhizhan Xu "Influence of probe tip size and incident light polarization on resolution in near-field scanning optical microscopy", Proc. SPIE 5635, Nanophotonics, Nanostructure, and Nanometrology, (9 February 2005); https://doi.org/10.1117/12.577201
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KEYWORDS
Optical spheres

Near field

Near field scanning optical microscopy

Polarization

Optical resolution

Near field optics

Radio propagation

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