Paper
22 January 2005 Fabrication of cantilever probes with integrated piezoresistive read-out and built-in piezoelectric actuators
Steve Olson, Bruce Altemus, Balasubramanian Sankaran, Natalya Tokranova, Robert Geer, James Castracane, Bai Xu
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Abstract
Micromachined cantilevers used as force probes in atomic force microscopy are extremely sensitive to a variety of environment factors such as acoustic noise, temperature and humidity. This unwanted interference can be exploited to produce highly sensitive systems with proper design and under precise conditions. In this paper, we report the development of a new generic process for the fabrication of a microprobe with integrated piezoresistive read-out and built-in piezoelectric actuators. The mechanical performance of cantilever probes of various dimensions was studied. The result from the Finite Element Analysis (FEA) was compared to the experimental results. Application of this probe in a nondestructive, general-purpose, near-field nanomechanical imaging system will be discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steve Olson, Bruce Altemus, Balasubramanian Sankaran, Natalya Tokranova, Robert Geer, James Castracane, and Bai Xu "Fabrication of cantilever probes with integrated piezoresistive read-out and built-in piezoelectric actuators", Proc. SPIE 5717, MEMS/MOEMS Components and Their Applications II, (22 January 2005); https://doi.org/10.1117/12.591024
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KEYWORDS
Silicon

Semiconducting wafers

Atomic force microscopy

Boron

Actuators

Etching

Metals

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