Paper
8 December 2004 The influence of rapid recurrent thermal annealing on magnetic properties of CoFe-O thin film
Yu Shi, Huaiwu Zhang, Yulan Jing, Huaizhong Xing, Xiangdong Jiang
Author Affiliations +
Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607332
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
The variation of magnetic properties with a new rapid recurrent thermal annealing (RRTA) were studied in high moment thin film (Co 0.35Fe0.65)99O1. After the rapid recurrent thermal annealing at 450°C for several periods of times, the coercivity as-deposited this thin film decreased from 105 to 3 Oe, and their resistivity was decreased to 70 percent. It is found that the method is more effective than other methods to improve the magnetic and electrical properties of (Co0.35Fe0.65)99O1 thin films.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu Shi, Huaiwu Zhang, Yulan Jing, Huaizhong Xing, and Xiangdong Jiang "The influence of rapid recurrent thermal annealing on magnetic properties of CoFe-O thin film", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); https://doi.org/10.1117/12.607332
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KEYWORDS
Annealing

Magnetism

Thin films

Iron

Tantalum

Oxygen

Atomic force microscopy

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