A novel integrated system for analysis of thermal depth profiles

J. Bante; C. Murray; J. R. Dutcher; Juan Jose Alvarado-Gil

doi:10.1117/12.611750

14 February 2005 A novel integrated system for analysis of thermal depth profiles

J. Bante, C. Murray, J. R. Dutcher, Juan Jose Alvarado-Gil

Proceedings Volume 5776, Eighth International Symposium on Laser Metrology; (2005) https://doi.org/10.1117/12.611750
Event: Eighth International Conference on Laser Metrology, 2005, Merida, Mexico

Abstract

In this work a novel system for the study of thermal profiles and time dependent heat diffusion is presented. In this system the modulation of light is made directly using an electronic driver that turns on and off the laser diode. The data acquisition is made with a higher accuracy than in the conventional systems because the electronics that detects the signal is the one that generates the modulating signal. The system is very compact and as a consequence, shows a higher stability, and can be integrated in systems in which other measurements are performed or inside of chambers where the conditions of the surroundings are controlled. In order to show the potential of our system, applications using photoacoustic and photopyroelectric techniques are presented. In the case of photoacoustics, the specific case of the open photoacoustic cell for thermal diffusion characterization is shown. Using a conventional photoacoustic cell, it is shown that the dynamics of evaporation and crosslinking can be followed in polymers. In the case of photopyroelectric technique, thermal depth profiles are also performed and the study of dynamics a as function of time is discussed. The advantages of our system and the different modes of detection are discussed.

Citation Download Citation

J. Bante, C. Murray, J. R. Dutcher, and Juan Jose Alvarado-Gil "A novel integrated system for analysis of thermal depth profiles", Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); https://doi.org/10.1117/12.611750

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available