Uncertainty analysis of the AEDC 7V chamber

Dustin Crider; Heard Lowry; Randy Nicholson; Kimberly Mead

doi:10.1117/12.600695

12 May 2005 Uncertainty analysis of the AEDC 7V chamber

Dustin Crider, Heard Lowry, Randy Nicholson, Kimberly Mead

Proceedings Volume 5784, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI; (2005) https://doi.org/10.1117/12.600695
Event: Defense and Security, 2005, Orlando, Florida, United States

Abstract

For over 30 years, the Space Systems Test Facility and space chambers at the Arnold Engineering Development Center (AEDC) have been used to perform space sensor characterization, calibration, and mission simulation testing of space-based, interceptor, and airborne sensors. In partnership with the Missile Defense Agency (MDA), capability upgrades are continuously pursued to keep pace with evolving sensor technologies. Upgrades to sensor test facilities require rigorous facility characterization and calibration activities that are part of AEDC's annual activities to comply with Major Range Test Facility Base processes to ensure quality metrology and test data. This paper discusses the ongoing effort to characterize and quantify Aerospace Chamber 7V measurement uncertainties. The 7V Chamber is a state-of-the-art cryogenic/vacuum facility providing calibration and high-fidelity mission simulation for infrared seekers and sensors against a low-infrared background. One of its key features is the high fidelity of the radiometric calibration process. Calibration of the radiometric sources used is traceable to the National Institute of Standards and Technology and provides relative uncertainties on the order of two to three percent, based on measurement data acquired during many test periods. Three types of sources of measurement error and top-level uncertainties have been analyzed; these include radiometric calibration, target position, and spectral output. The approach used and presented is to quantify uncertainties of each component in the optical system and then build uncertainty diagrams and easily updated databases to detail the uncertainty for each optical system. The formalism, equations, and corresponding analyses are provided to help describe how the specific quantities are derived and currently used. This paper presents the uncertainty methodology used and current results.

Citation Download Citation

Dustin Crider, Heard Lowry, Randy Nicholson, and Kimberly Mead "Uncertainty analysis of the AEDC 7V chamber", Proc. SPIE 5784, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI, (12 May 2005); https://doi.org/10.1117/12.600695

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