Interferometric method for measuring the refractive index profile of optical waveguides directly written in glass substrates by femtosecond laser

P. Ferraro; L. Aiello; S. De Nicola; A. Finizio; R. Osellame; N. Chiodo; V. Maselli; G. Cerullo; P. Laporta

doi:10.1117/12.612889

26 August 2005 Interferometric method for measuring the refractive index profile of optical waveguides directly written in glass substrates by femtosecond laser

P. Ferraro, L. Aiello, S. De Nicola, A. Finizio, R. Osellame, N. Chiodo, V. Maselli, G. Cerullo, P. Laporta

Author Affiliations +

Proceedings Volume 5858, Nano- and Micro-Metrology; 585804 (2005) https://doi.org/10.1117/12.612889
Event: Optical Metrology, 2005, Munich, Germany

Abstract

Direct waveguide writing by femtosecond lasers is rapidly becoming a promising valid alternative to standard fabrication techniques. Significant research efforts are devoted to understanding the effects of interaction of the radiation with the material and determining the key parameters in the writing process. The assessment of a reliable fabrication process depends crucially also on the availability of high resolution inspection and measurement methods. In this paper we employ digital holography (DH) in a microscope configuration as the characterization tool for measuring the refractive index profile of the waveguides. The method offers the advantages of high spatial resolution, high sensitivity and it allows to determine an absolute value of refractive index change without the need of any calibration. We report on the optical characterization of optical waveguides operating at 1.5 micron wavelength in two commercial glasses written by a stretched-cavity femtosecond Ti:sapphire oscillator. Measurements made by DH have evidenced a strong dependence of the fabrication process on the type of glass substrate.

Citation Download Citation

P. Ferraro, L. Aiello, S. De Nicola, A. Finizio, R. Osellame, N. Chiodo, V. Maselli, G. Cerullo, and P. Laporta "Interferometric method for measuring the refractive index profile of optical waveguides directly written in glass substrates by femtosecond laser", Proc. SPIE 5858, Nano- and Micro-Metrology, 585804 (26 August 2005); https://doi.org/10.1117/12.612889

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available