Ellipsometry study of Cu-based shape memory films in a wide spectral range

Y. V. Filipov; V. S. Staschuk; L. V. Poperenko

doi:10.1117/12.617737

18 August 2005 Ellipsometry study of Cu-based shape memory films in a wide spectral range

Y. V. Filipov, V. S. Staschuk, L. V. Poperenko

Proceedings Volume 5868, Optical Materials and Structures Technologies II; 586810 (2005) https://doi.org/10.1117/12.617737
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

Adaptive materials integrate actuating and sensing materials into a structural material. The development of polymer composites with embedded shape memory alloys can open new perspectives with respect to the development of engineering structures with adaptive shape, stiffness, damping and other properties. The development of these advanced composites with embedded shape memory alloy wires is still in an embryonic stage. Given ellipsometry measurements of optical properties copper based alloy which require further research before these adaptive composites can be used in industrial applications.

Citation Download Citation

Y. V. Filipov, V. S. Staschuk, and L. V. Poperenko "Ellipsometry study of Cu-based shape memory films in a wide spectral range", Proc. SPIE 5868, Optical Materials and Structures Technologies II, 586810 (18 August 2005); https://doi.org/10.1117/12.617737

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