Paper
18 August 2005 Rockwell CMOS hybrid imager as a soft x-ray imaging spectrometer
A. T. Kenter, R. Kraft, S. Nulsen, G. Meehan, S. S. Murray
Author Affiliations +
Abstract
We present preliminary results on the operation of a Rockwell CMOS Hybrid imager as a soft X-ray imaging spectrometer. The CMOS Hybrid technology provides several significant advantages over conventional CCDs for high-energy astrophysics applications, and may be a viable alternative for future missions. The Rockwell Hybrid Visible Silicon (HyViSITM) imager consists of a thin slab of high-resistivity silicon which is flip-chip bonded using indium bumps to a Rockwell PICNIC CMOS multiplexer. Unlike more common CMOS imagers, the flip-chip bonding of the HYVISI provides 100% fill factor. The high-resistivity silicon provides high QE over the soft X-ray bandpass, while the multiplexer provides high level electronic integration. The detector has an amplifier per pixel, and various readout modes. The readout modes include the possibility of selecting arbitrary regions of interest and Fowler sampling to decrease noise and improve energy performance. We report on read noise, QE, and energy resolution, and on the effectiveness of multiple reads for noise reduction. We discuss future directions for this very promising technology which would make it ideal for use as an astronomical imaging spectrometer in the soft X-ray band.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. T. Kenter, R. Kraft, S. Nulsen, G. Meehan, and S. S. Murray "Rockwell CMOS hybrid imager as a soft x-ray imaging spectrometer", Proc. SPIE 5898, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV, 58981P (18 August 2005); https://doi.org/10.1117/12.632560
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Cited by 3 scholarly publications.
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KEYWORDS
X-rays

Sensors

Quantum efficiency

Silicon

Multiplexers

X-ray imaging

Aluminum

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