Paper
1 May 1986 The Measurement And Analysis Of The Noise Frequency Spectrum For SPRITE Infrared Detectors
S. P. Braim
Author Affiliations +
Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.951980
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
The noise frequency spectrum of over 100 SPRITE infrared detector filaments has been measured, at 5 different bias fields, between 600Hz and 10MHz. A 5-variable parametric equation has been fitted to each data set to enable the variations of different parameters to be assessed.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. P. Braim "The Measurement And Analysis Of The Noise Frequency Spectrum For SPRITE Infrared Detectors", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); https://doi.org/10.1117/12.951980
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Cited by 3 scholarly publications.
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KEYWORDS
Sensors

Resistance

Infrared detectors

Infrared technology

Diffusion

Chlorine

Imaging systems

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