Temporally-resolved area-imaged velocimeter system for dynamic materials experiments

Thomas E. Tierney IV; Damian C. Swift; Billy N. Vigil; Dennis L. Paisley; Sheng-Nian Luo; Randall P. Johnson; Samuel A. Letzring

doi:10.1117/12.622285

21 September 2005 Temporally-resolved area-imaged velocimeter system for dynamic materials experiments

Thomas E. Tierney IV, Damian C. Swift, Billy N. Vigil, Dennis L. Paisley, Sheng-Nian Luo, Randall P. Johnson, Samuel A. Letzring

Author Affiliations +

Proceedings Volume 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications; 59200Z (2005) https://doi.org/10.1117/12.622285
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

Shocks extending across crystals' grain boundaries can nucleate and grow velocity fluctuations on the order of 5-10% when the shock speeds differ in the adjacent grains. Dynamic materials experiments at the Los Alamos National Laboratory Trident Laser Laboratory aim to examine this phenomenon by temporally- and spatially-resolving free surface velocity over a large region of interest. While line-imaged velocimetry can serve as a quantitative method for examining the velocity fluctuations across a single boundary, it is more desirable to resolve the velocity field around an entire embedded grain. We present a novel diagnostic design that utilizes a four-frame gated-optical-imaging interferometric velocimeter in combination with a streaked line-imaging interferometric velocimeter. This diagnostic will provide high-spatial resolution velocigraphs of a shock as it hits a free surface in multigrain crystals.

Citation Download Citation

Thomas E. Tierney IV, Damian C. Swift, Billy N. Vigil, Dennis L. Paisley, Sheng-Nian Luo, Randall P. Johnson, and Samuel A. Letzring "Temporally-resolved area-imaged velocimeter system for dynamic materials experiments", Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 59200Z (21 September 2005); https://doi.org/10.1117/12.622285

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