Paper
20 January 2006 Real-time measurement and high-speed identification of highway pavement surface deformation
Lin Fu, Anzhi He, Zhenhua Li
Author Affiliations +
Proceedings Volume 6027, ICO20: Optical Information Processing; 60270R (2006) https://doi.org/10.1117/12.667910
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
Pavement distress status is very important to investigate and evaluate pavement condition, which is characterized by distress types, degree and area. The measurement of three dimensions structure of pavement surface is of great value for the judgment of pavement distress status. Optical three dimensional profilometry is a well established technique for the measurement of three dimensions surface profiles, which has many advantages such as non-contact, high precision, rapid measurement and high automatization degree. Grating projection based Fourier transform profilometry encodes object height information into deformations of sine fringes projected on the object. This profilometry can measure objects in orthogonal direction. In this paper, the application of the Fourier transform profilometry is discussed in a dynamic real-time measurement system of highway pavement surface profile. By the introduction of a specific reference plane, an adapting template matching method based image characteristic identification is developed for Fourier transform profilometry. Distressed pavement surfaces can be identified by the method. It realizes real-time measurement and high-speed identification of highway pavement surface distress by quantitatively presenting pavement deformations and the coordinates of distressed pavement surfaces.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lin Fu, Anzhi He, and Zhenhua Li "Real-time measurement and high-speed identification of highway pavement surface deformation", Proc. SPIE 6027, ICO20: Optical Information Processing, 60270R (20 January 2006); https://doi.org/10.1117/12.667910
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KEYWORDS
Fourier transforms

3D metrology

Image segmentation

Data processing

Phase shifts

Image processing

Modulation

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