Paper
20 February 2006 Analysis of the measurement uncertainty of a positional error calibrator based on a laser interferometer
Zhiyong Qu, Yu Yao
Author Affiliations +
Proceedings Volume 6041, ICMIT 2005: Information Systems and Signal Processing; 60411B (2006) https://doi.org/10.1117/12.664329
Event: ICMIT 2005: Merchatronics, MEMS, and Smart Materials, 2005, Chongqing, China
Abstract
A positional error calibrator for evaluating the positioning accuracy of 6-dof simulation system under dynamic conditions has been developed. It is based on the Hewlett Packard 5529A laser interferometer, which is capable of performing dynamic calibration. This laser interferometer measures the position of the slide as it moves continuously along the simulation system axis under test. The data are collected on a position basis by triggering the laser interferometer from a position-based reference signal. A software package has been developed for data acquisition and presentation of the positional errors in accordance with ISO 230-2 standard. This paper deals with the evaluation of the measurement uncertainty of this positional error calibrator. In order to assess the total measurement uncertainty of this calibrator, an analysis of the individual errors that make up the accuracy and repeatability error budgets has been carried out. These error budgets consist of three components. This uncertainty analysis was carried out when this calibrator was used to assess the positional errors of a 6-dof simulation system.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhiyong Qu and Yu Yao "Analysis of the measurement uncertainty of a positional error calibrator based on a laser interferometer", Proc. SPIE 6041, ICMIT 2005: Information Systems and Signal Processing, 60411B (20 February 2006); https://doi.org/10.1117/12.664329
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometers

Calibration

Error analysis

Distance measurement

Laser systems engineering

Temperature metrology

Electronics

Back to Top