Analytical model of skew effect in digital press characterization

Mu Qiao; Jan P. Allebach

doi:10.1117/12.660252

17 February 2006 Analytical model of skew effect in digital press characterization

Mu Qiao, Jan P. Allebach

Proceedings Volume 6076, Digital Publishing; 60760D (2006) https://doi.org/10.1117/12.660252
Event: Electronic Imaging 2006, 2006, San Jose, California, United States

Abstract

In this paper we propose an analytical model of the skew effect in digital press characterization. Digital press characterization gives critical information based on which one can predict how a certain layout, images, and text will be rendered by the press on a particular substrate. Modulation Transfer Function (MTF) analysis characterizes the digital press of interest using MTF test patches designed with different spatial frequencies, tone levels, angles, and colors. These patches are printed and then scanned. However, at high spatial frequencies, a small mis-registration in the scanned image can produce large distortion. Skew is a common image misregistration introduced in image analysis processes due to the imperfect alignment between the scan target media and the scanning device. The conventional method of de-skewing by rotating the scanned image is not desirable because of the large amount of data in high resolution scans. We present a strategy for rejecting skewed images based on the skew angle and the error tolerance so that they can be rescanned and also a simple procedure to correct the skew effect based on our analytical model. With our scheme, special marks are designed and printed along with the MTF test target page to aid the calculation of the skew angle. A threshold for the acceptable maximum skew angle is calculated using the properties of the MTF test target page pattern and the error tolerance. An image with skew angle larger than the threshold will be rejected. A look-up table can be generated to compensate for the skew effect on the MTF measurement.

Citation Download Citation

Mu Qiao and Jan P. Allebach "Analytical model of skew effect in digital press characterization", Proc. SPIE 6076, Digital Publishing, 60760D (17 February 2006); https://doi.org/10.1117/12.660252

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available