Paper
15 February 2006 Highly reliable high-power broad area laser diodes
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Abstract
We report results of multi-cell life tests performed on nearly (500) laser diodes representing our new generation of very efficient high power broad area 9xx nm lasers. The acceleration model showed a steep power dependence of the failure rate with an exponent of nearly 6. Improvement in the facet passivation process resulted in significantly less power acceleration of failures. Analysis of the life test on upgraded lasers showed median lifetime of 1,500,000 hours at operating conditions of 8W and 350°C. Optical powers as high as 17.8W for thermally limited CW operation and 32W for 20 μs pulsed operation were recorded. The CW life test was complemented by a life test performed at power cycling conditions (1Hz repetition rate, 50% duty cycle).
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor Rossin, Matthew Peters, Erik Zucker, and Bruno Acklin "Highly reliable high-power broad area laser diodes", Proc. SPIE 6104, High-Power Diode Laser Technology and Applications IV, 610407 (15 February 2006); https://doi.org/10.1117/12.660238
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Cited by 9 scholarly publications.
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KEYWORDS
Failure analysis

High power lasers

Semiconductor lasers

Diodes

Reliability

Broad area laser diodes

Continuous wave operation

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