Study on precise measurement of high reflectivity by cavity ring-down spectroscopy

Gang Ren; Bang-wei Cai; Bin Zhang; Sheng-ming Xiong; Wei Huang; Li-feng Gao

doi:10.1117/12.678091

19 May 2006 Study on precise measurement of high reflectivity by cavity ring-down spectroscopy

Gang Ren, Bang-wei Cai, Bin Zhang, Sheng-ming Xiong, Wei Huang, Li-feng Gao

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61500O (2006) https://doi.org/10.1117/12.678091
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

Using cavity ring-down spectroscopy technique, the precise measurement device for the high reflectivity at 1.315μm has been built. Tested reflectivity of high-reflecting mirror is as high as 99.979%. The precision of measurement is at the 10^-5 level. For further investigation, some factors such as the instability of laser source, the cavity length, the diaphragm aperture and detector position, the mode match, the reflectivity of cavity mirror, which may affect the precision of measurement are studied. Our study will provide a theoretical and experimental reference for further improvement of the measuring accuracy.

Citation Download Citation

Gang Ren, Bang-wei Cai, Bin Zhang, Sheng-ming Xiong, Wei Huang, and Li-feng Gao "Study on precise measurement of high reflectivity by cavity ring-down spectroscopy", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500O (19 May 2006); https://doi.org/10.1117/12.678091

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