Paper
26 April 2006 Thermal instability of sampling moment in wide-band digitizing oscilloscopes
Maciej Radtke, Katarzyna Opalska, Tomasz Starecki
Author Affiliations +
Proceedings Volume 6159, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments IV; 61592U (2006) https://doi.org/10.1117/12.674853
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments IV, 2005, Wilga, Poland
Abstract
The paper discusses some problems concerned with instability of time delay in ultra fast sampling circuits, used in digital oscilloscopes of gigahertz bandwidth. Measurement of thermal change of delay time of step recovery diodes are presented. Suggestions how to reduce and/or compensate the effect are included.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maciej Radtke, Katarzyna Opalska, and Tomasz Starecki "Thermal instability of sampling moment in wide-band digitizing oscilloscopes", Proc. SPIE 6159, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments IV, 61592U (26 April 2006); https://doi.org/10.1117/12.674853
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Cited by 1 scholarly publication.
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KEYWORDS
Diodes

Oscilloscopes

Temperature metrology

Digital electronics

Picosecond phenomena

Ultrafast phenomena

Transistors

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