Paper
22 April 2006 Size factor of a fast film photodetector based on the optical rectification effect
Gennady M. Mikheev, Ruslan G. Zonov, Alexander N. Obraztsov
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Abstract
The photodetector based on optical rectification effect (ORE) was created using nanostructured carbon (nanographite) films. Sensitivity of the photodetector was studied in dependence on the carbon films size. It is shown that amplitude of electrical pulses generated by the photodetector depends on the thickness, length and width of the film area. The maximal sensitivity is reached at the film thickness of about 2.5 micrometers. It is shown also that the photoelectrical pulses appearing on the nanographite film have different nature than those appearing in on the silicon substrate.
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Gennady M. Mikheev, Ruslan G. Zonov, and Alexander N. Obraztsov "Size factor of a fast film photodetector based on the optical rectification effect", Proc. SPIE 6189, Optical Sensing II, 61891Y (22 April 2006); https://doi.org/10.1117/12.662611
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KEYWORDS
Electrodes

Photodetectors

Silicon

Frequency conversion

Silicon films

Pulsed laser operation

Resistance

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