Measuring reality, solving the slope dilemma, and redefining the particle size distribution model

Kerri J. Wilkerson; Philip G. Magallanes; Jonathan P. Elders; Ronald V. Peterson

doi:10.1117/12.695250

7 September 2006 Measuring reality, solving the slope dilemma, and redefining the particle size distribution model

Kerri J. Wilkerson, Philip G. Magallanes, Jonathan P. Elders, Ronald V. Peterson

Proceedings Volume 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II; 62910I (2006) https://doi.org/10.1117/12.695250
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

In contamination control technology relatively dirty surfaces cannot be specified with the same defining equations as those for "clean" surfaces. The current practices in the aerospace community disregard this inaccuracy in defining and specifying gradations of surface cleanliness. Using a 0.926 slope with an IEST-STD-CC1246D particle distribution to describe cleanliness on dirty surfaces, or surfaces subjected to fallout, is inaccurate, unrealistic, misleading, and often impossible to verify. Most importantly, using this model provides incorrect information to experts who calculate sensor performance: a slope of 0.926 is appropriate only for cleaned surfaces. However, the industry continues to use the same slope to describe all surfaces, clean or dirty. Current measurements taken from Raytheon labs have shown that particle distributions dominated by fallout typically have a slope between 0.3 and 0.5, in concurrence with previous studies. Based on the accumulated data, the authors propose that particle distributions for dirty surfaces be described by a second model, which should be incorporated into the next revision of IEST-STD-CC1246.

Citation Download Citation

Kerri J. Wilkerson, Philip G. Magallanes, Jonathan P. Elders, and Ronald V. Peterson "Measuring reality, solving the slope dilemma, and redefining the particle size distribution model", Proc. SPIE 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II, 62910I (7 September 2006); https://doi.org/10.1117/12.695250

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
11 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Particles

Picture Archiving and Communication System

Contamination

Semiconducting wafers

Statistical analysis

Aerospace engineering

Contamination control

Show All Keywords

Keywords/Phrases

Search In:

Publication Years