Paper
14 August 2006 Advanced wave-front sensing by quadri-wave lateral shearing interferometry
Sabrina Velghe, Jérôme Primot, Nicolas Guérineau, Riad Haïdar, Sébastien Demoustier, Mathieu Cohen, Benoît Wattellier
Author Affiliations +
Abstract
Based on multi-lateral shearing interferometry, a powerful technique, called the Quadri-Wave Lateral Shearing Interferometer (QWLSI) is used to evaluate the wavefront in an accurate and precise way. Our device can be used for the characterization of complex and very aberrant optical devices, the control of optical components and also for laser beam evaluation. This communication will detail the response of the QWLSI and its metrological performances, such as its high resolution, its adjustable sensitivity and dynamic. It will then be focused on two innovative applications of the QWLSI. The first application concerns the evaluation of infrared lenses dedicated to high-performance cameras. We will present experimental results recently completed by our prototype dedicated to the LWIR domain (λ=8-14μm). In a second part, we will study the possibility to analyze wave-fronts with discontinuities. Such wave-fronts can be produced by segmented mirrors, diffractive components or also bundle of single-mode fibers. We will finally present simulation results for this latter application.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sabrina Velghe, Jérôme Primot, Nicolas Guérineau, Riad Haïdar, Sébastien Demoustier, Mathieu Cohen, and Benoît Wattellier "Advanced wave-front sensing by quadri-wave lateral shearing interferometry", Proc. SPIE 6292, Interferometry XIII: Techniques and Analysis, 62920E (14 August 2006); https://doi.org/10.1117/12.681533
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Cited by 5 scholarly publications.
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KEYWORDS
Shearing interferometers

Cameras

Interferometry

Lenses

Metrology

Sensors

Long wavelength infrared

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