Paper
6 November 2006 Study of the thermal characteristic of x-ray mask during short-pulsed exposure
Hongyan Shang, Yongkun Wang
Author Affiliations +
Abstract
Three-dimensional finite element short-pulsed models of X-ray mask have been developed and the energy absorption function along the mask thickness direction has been considered. The results show that the absorber's temperature is higher than the substrate's because the absorber has higher absorption coefficient. In addition, the lower the absorber coverage of the mask, the lower the mask temperature is. The transient simulation results show that the mask temperature reached the maximum at the end of the short-pulsed exposure. It occurs at the interface between the substrate and the absorber, and the maximum is 52.7°C.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongyan Shang and Yongkun Wang "Study of the thermal characteristic of x-ray mask during short-pulsed exposure", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63573M (6 November 2006); https://doi.org/10.1117/12.717246
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

Absorption

3D modeling

Temperature metrology

Finite element methods

Distortion

Gold

RELATED CONTENT


Back to Top