Confocal scanning electroluminescence spectro-microscope for multidimensional light-emitting property analysis

S. Hong; G. Onushkin; J. S. Park; B. K. Kim; D.-Y. Lee; A. Fomin; K. Ko; J. W. Kim

doi:10.1117/12.700079

8 February 2007 Confocal scanning electroluminescence spectro-microscope for multidimensional light-emitting property analysis

S. Hong, G. Onushkin, J. S. Park, B. K. Kim, D.-Y. Lee, A. Fomin, K. Ko, J. W. Kim

Author Affiliations +

Proceedings Volume 6473, Gallium Nitride Materials and Devices II; 64731S (2007) https://doi.org/10.1117/12.700079
Event: Integrated Optoelectronic Devices 2007, 2007, San Jose, California, United States

Abstract

We report new type of micro-EL instrument and its applications for light emitting devices. Our new micro-EL, so-called confocal scanning electroluminescence sprctro-microscope (CSESM) has not only fast image acquisition time but also high image resolution. The newly developed CSESM is combined with confocal laser scanning photoluminescence micsoscope, i.e. micro-PL. Therefore, micro-EL distribution can be directly matched with micro-PL and mechanical chip structure of LED. It is fruitful for providing a fast and non-destructive method to analyze the homogeneity of LEDs in its completely proceeded form. Using this apparatus, we study local intensity and wavelength distribution of electroluminescence for InGaN/GaN blue LED chip. Our results represent that local fluctuations of electroluminescence intensity and wavelength position are closely connected with the fluctuation of local current density, i.e. current spreading features on LED chips.

Citation Download Citation

S. Hong, G. Onushkin, J. S. Park, B. K. Kim, D.-Y. Lee, A. Fomin, K. Ko, and J. W. Kim "Confocal scanning electroluminescence spectro-microscope for multidimensional light-emitting property analysis", Proc. SPIE 6473, Gallium Nitride Materials and Devices II, 64731S (8 February 2007); https://doi.org/10.1117/12.700079

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