Scanners for analytic print measurement: the devil in the details

Eric K. Zeise; Don Williams; Peter D. Burns; William C. Kress

doi:10.1117/12.705564

29 January 2007 Scanners for analytic print measurement: the devil in the details

Eric K. Zeise, Don Williams, Peter D. Burns, William C. Kress

Proceedings Volume 6494, Image Quality and System Performance IV; 64940L (2007) https://doi.org/10.1117/12.705564
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States

Abstract

Inexpensive and easy-to-use linear and area-array scanners have frequently substituted as colorimeters and densitometers for low-frequency (i.e., large area) hard copy image measurement. Increasingly, scanners are also being used for high spatial frequency, image microstructure measurements, which were previously reserved for high performance microdensitometers. In this paper we address characteristics of flatbed reflection scanners in the evaluation of print uniformity, geometric distortion, geometric repeatability and the influence of scanner MTF and noise on analytic measurements. Suggestions are made for the specification and evaluation of scanners to be used in print image quality standards that are being developed.

Citation Download Citation

Eric K. Zeise, Don Williams, Peter D. Burns, and William C. Kress "Scanners for analytic print measurement: the devil in the details", Proc. SPIE 6494, Image Quality and System Performance IV, 64940L (29 January 2007); https://doi.org/10.1117/12.705564

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