Paper
16 March 2007 A wafer scale active pixel CMOS image sensor for generic x-ray radiology
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Abstract
This paper describes a CMOS Active Pixel Image Sensor developed for generic X-ray imaging systems using standard CMOS technology and an active pixel architecture featuring low noise and a high sensitivity. The image sensor has been manufactured in a standard 0.35 μm technology using 8" wafers. The resolution of the sensor is 3360x3348 pixels of 40x40 μm2 each. The diagonal of the sensor measures little over 190 mm. The paper discusses the floor planning, stitching diagram, and the electro-optical performance of the sensor that has been developed.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Danny Scheffer "A wafer scale active pixel CMOS image sensor for generic x-ray radiology", Proc. SPIE 6510, Medical Imaging 2007: Physics of Medical Imaging, 65100O (16 March 2007); https://doi.org/10.1117/12.708433
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CITATIONS
Cited by 27 scholarly publications.
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KEYWORDS
Sensors

Semiconducting wafers

X-rays

Image sensors

X-ray imaging

CMOS sensors

Cadmium sulfide

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