Paper
1 May 2007 Based on photo-electro position sensitive detector contour damage diagnosis measurement system research
Tianze Li, Jin Shen, Shuyun Wang
Author Affiliations +
Proceedings Volume 6534, Fifth International Conference on Photonics and Imaging in Biology and Medicine; 653421 (2007) https://doi.org/10.1117/12.741618
Event: Fifth International Conference on Photonics and Imaging in Biology and Medicine, 2006, Wuhan, China
Abstract
Based on the lateral photo effect of the semiconductor photoelectric position sensitive device, Developing a new kind of photo-electro position sensitive detector as the receiver of the laser beam, taking the laser as the launcher, and using optical lens, light filter .etc, we have designed a new kind of 3D non-contact optical measurement system with high accuracy and high resolution. The characteristics of this system are demonstrated as: very high response speed; very high position resolution; the position output has nothing to do with the intensity of the light spot as well as the size of it, only if the center of gravity of it is related; And it can detect the intensity and the position of the incident light spot at the same time, etc. On the basis of the ruled lines of the Cartesian axes located on the object that is measured, it can produce the contour of the object, which provides a optical detecting method that can measure the marginal date accurately for detecting irregular shape and early surgical analysis and diagnosis. This measurement system has very high application value for the clinical diagnosis. Finally, it has analyzed the factors affecting system precision and causes of the system errors, and has provided the experimental result and several important conclusions.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tianze Li, Jin Shen, and Shuyun Wang "Based on photo-electro position sensitive detector contour damage diagnosis measurement system research", Proc. SPIE 6534, Fifth International Conference on Photonics and Imaging in Biology and Medicine, 653421 (1 May 2007); https://doi.org/10.1117/12.741618
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KEYWORDS
Sensors

3D metrology

Skin

Optical testing

Semiconductors

Electronic components

Injuries

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