Characterization of a C-QWIP LWIR camera

David P. Forrai; Mark Sempsrott; Robert Fischer; Kwong-Kit Choi; John W. Devitt

doi:10.1117/12.719255

30 April 2007 Characterization of a C-QWIP LWIR camera

David P. Forrai, Mark Sempsrott, Robert Fischer, Kwong-Kit Choi, John W. Devitt

Proceedings Volume 6543, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII; 654317 (2007) https://doi.org/10.1117/12.719255
Event: Defense and Security Symposium, 2007, Orlando, Florida, United States

Abstract

Large format corrugated quantum well infrared photodetector (C-QWIP) focal plane arrays (FPAs) have been developed over the past two years. The results of this development have demonstrated the potential for this technology to satisfy requirements for very large format high performance long-wave infrared (LWIR) imaging systems. One particular C-QWIP design has focused on developing an FPA that operates in the 8 to 10 &mgr;m spectrum with integration times in the millisecond regime when used against warm backgrounds. This FPA is very suitable for many LWIR applications and has been integrated into a camera system. The specifications of that camera are described in this paper. The characterization of this camera system includes standard electro-optical tests and compares the results of those tests to theoretical models for the FPA. This paper concludes by describing the ongoing effort to tailor the system specifically for the C-QWIP. This includes design features of the read-out integrated circuit (ROIC), dewar-cooler design and interfacing electronics, and video processing. This thorough characterization of the camera has demonstrated the utility of the C-QWIP FPA for LWIR imaging and has established a path forward to further improve the performance of imaging systems implementing this technology.

Citation Download Citation

David P. Forrai, Mark Sempsrott, Robert Fischer, Kwong-Kit Choi, and John W. Devitt "Characterization of a C-QWIP LWIR camera", Proc. SPIE 6543, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII, 654317 (30 April 2007); https://doi.org/10.1117/12.719255

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