Super-resolution for infrared beam profile measurement

Ulrich H. P. Fischer-Hirschert; Thomas Windel; Igor Zakharov; Dmitry Dovnar

doi:10.1117/12.721623

16 May 2007 Super-resolution for infrared beam profile measurement

Ulrich H. P. Fischer-Hirschert, Thomas Windel, Igor Zakharov, Dmitry Dovnar

Author Affiliations +

Proceedings Volume 6585, Optical Sensing Technology and Applications; 65851B (2007) https://doi.org/10.1117/12.721623
Event: International Congress on Optics and Optoelectronics, 2007, Prague, Czech Republic

Abstract

The resolution parameter of CCD is the factor which limits the spatial resolution of optoelectronic system. The using of high-resolution CCD is not always possible, especially for measurements in IR wavelength (1350nm) band. The purpose of given work is increasing the spatial resolution of the newly introduced Medianfield method which is focused on beam profile measurements for fiber-chip coupling systems by means of processing low-resolution images sequences. The results of numeric experiments show that the given image restoration method makes it possible the super-resolution restoration of images for possible transmission of information about high spatial frequencies, through diffraction limited optical system. Theoretical assessment allows to predict required conditions for this transmission. Results of experiments for super-resolution images which differ by sub-pixel shift show possibility of theoretical prediction optimal parameters for image (signal) restoration (required number of processed images, point spread function and etc.)

Citation Download Citation

Ulrich H. P. Fischer-Hirschert, Thomas Windel, Igor Zakharov, and Dmitry Dovnar "Super-resolution for infrared beam profile measurement", Proc. SPIE 6585, Optical Sensing Technology and Applications, 65851B (16 May 2007); https://doi.org/10.1117/12.721623

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