Applications of intense ultra-short XUV pulses to solid state physics: time resolved luminescence spectroscopy and radiation damage studies

M. De Grazia; H. Merdji; B. Carré; J. Gaudin; G. Geoffroy; S. Guizard; N. Fedorov; A. Belsky; P. Martin; M. Kirm; V. Babin; E. Feldbach; S. Vielhauer; V. Nagirnyi; A. Vassil'ev; F. Krejci; J. Kuba; J. Chalupsky; J. Cihelka; V. Hajkova; M. Ledinský; L. Juha

doi:10.1117/12.724006

15 June 2007 Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies

M. De Grazia, H. Merdji, B. Carré, J. Gaudin, G. Geoffroy, S. Guizard, N. Fedorov, A. Belsky, P. Martin, M. Kirm, V. Babin, E. Feldbach, S. Vielhauer, V. Nagirnyi, A. Vassil'ev, F. Krejci, J. Kuba, J. Chalupsky, J. Cihelka, V. Hajkova, M. Ledinský, L. Juha

Author Affiliations +

Proceedings Volume 6586, Damage to VUV, EUV, and X-ray Optics; 65860I (2007) https://doi.org/10.1117/12.724006
Event: International Congress on Optics and Optoelectronics, 2007, Prague, Czech Republic

Abstract

The new XUV sources, which deliver spatially coherent pulses of high peak power, allow to study elementary processes in the light/solid interaction in the high intensity regime (⩾10¹¹W/cm²). Here, we report two studies which have used high-order laser harmonics (HH) generated in gas as the excitation source. Firstly, we have investigated the dynamics of electron relaxation in the wide gap CdWO₄ dielectric crystal, an efficient scintillator material, using time-resolved luminescence spectroscopy. The kinetics decay of luminescence shows evidence of non radiative relaxation of the self-trapped excitons at the &mgr;s damage to surfaces of poly(methyl methacrylate) - PMMA, induced by a multi-shot XUV-irradiation (1 kHz reprate) for given fluence, below damage threshold range of ≈mJ/cm². The main processes participating in the surface modification, polymer chain scission followed by the blow up of the volatile, molecular fragments and cross-linking in the near-surface layer of remaining material, are tentatively identified and associated to, crater formation for short-time exposure (< 1min) and surface hardening for long-time exposure (⩾1min).

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M. De Grazia, H. Merdji, B. Carré, J. Gaudin, G. Geoffroy, S. Guizard, N. Fedorov, A. Belsky, P. Martin, M. Kirm, V. Babin, E. Feldbach, S. Vielhauer, V. Nagirnyi, A. Vassil'ev, F. Krejci, J. Kuba, J. Chalupsky, J. Cihelka, V. Hajkova, M. Ledinský, and L. Juha "Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies", Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860I (15 June 2007); https://doi.org/10.1117/12.724006

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