Paper
20 September 2007 Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor
S. Goto, S. Takahashi, T. Kudo, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa
Author Affiliations +
Abstract
We characterized beryllium foils and CVD diamond films/plates for synchrotron radiation beamline windows and x-ray beam monitor especially in coherent x-ray applications. Sub-micron-resolution imaging with a zooming tube was performed using spatially coherent x-rays at 1-km beamline 29XU of SPring-8. We found that the speckles observed in the conventional powder and ingot beryllium foils were due to voids with diameter of several to ten-several microns. The physical vapor deposition (PVD) eliminated the voids and the PVD beryllium showed the best performance with no speckles. We characterized a commercially available polycrystalline CVD diamond window and CVD films as well as beryllium foils. Polished thin diamond film showed rather uniform transmission image. We found dark spots at in-line image due to Bragg diffraction from grains for thicker CVD diamond window.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Goto, S. Takahashi, T. Kudo, M. Yabashi, K. Tamasaku, Y. Nishino, and T. Ishikawa "Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor", Proc. SPIE 6705, Advances in X-Ray/EUV Optics and Components II, 67050H (20 September 2007); https://doi.org/10.1117/12.735356
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Cited by 11 scholarly publications.
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KEYWORDS
Beryllium

X-rays

Diamond

Chemical vapor deposition

Polishing

X-ray imaging

Image transmission

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