Application of CdTe photon-counting x-ray imager to material discriminated x-ray CT

Takuya Nakashima; Hisashi Morii; Yoichiro Neo; Hidenori Mimura; Toru Aoki

doi:10.1117/12.733987

21 September 2007 Application of CdTe photon-counting x-ray imager to material discriminated x-ray CT

Takuya Nakashima, Hisashi Morii, Yoichiro Neo, Hidenori Mimura, Toru Aoki

Proceedings Volume 6706, Hard X-Ray and Gamma-Ray Detector Physics IX; 67060C (2007) https://doi.org/10.1117/12.733987
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

We proposed that material discriminated X-ray CT with conventional X-ray tube and energy differentiation type 64ch CdTe radiation line sensor. Distribution of Atomic number was obtained by using dual-energy X-ray CT. In this study, problem of conventional X-ray tube was reduced by the collimator and measurement time. So line attenuation coefficient was obtained depend on theory. Atomic number was calculated with two different methods. We could obtain atomic number within about three error margin.

Citation Download Citation

Takuya Nakashima, Hisashi Morii, Yoichiro Neo, Hidenori Mimura, and Toru Aoki "Application of CdTe photon-counting x-ray imager to material discriminated x-ray CT", Proc. SPIE 6706, Hard X-Ray and Gamma-Ray Detector Physics IX, 67060C (21 September 2007); https://doi.org/10.1117/12.733987

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available