Paper
28 November 2007 A compact, high-speed, desktop turnkey measurement system for the characterization of the surface topography of spherical, aspherical and toroidal surfaces
Stephen D. Fantone, David A. Imrie, Jian Zhang
Author Affiliations +
Abstract
This paper describes a desktop, turnkey metrology system tailored for the measurement of the surface topography of small optical components such as contact and intraocular lenses and molds. The system incorporates a wavefront sensor that provides interferometric accuracy while being relatively insensitive to vibration. Highly accurate measurement of the radius of curvature (typically better than .02%, 2 micrometers on a 10 mm radius part) is obtained using a patented data reduction system. The system also measures toroidal and aspherical systems and can be readily adapted to the measurement of longer radius parts. The system is capable of measuring surface topography in less than 10 seconds after part placement and is usually operated by unskilled personnel. Full three-dimensional topography is reported including peak-to-valley and root-mean-square surface departure, and Zernike polynomials. This paper provides an overview of the optical configuration and software algorithms that enable the highly precise capability of the device.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen D. Fantone, David A. Imrie, and Jian Zhang "A compact, high-speed, desktop turnkey measurement system for the characterization of the surface topography of spherical, aspherical and toroidal surfaces", Proc. SPIE 6834, Optical Design and Testing III, 68340P (28 November 2007); https://doi.org/10.1117/12.757720
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KEYWORDS
Objectives

Wavefronts

Head

Collimation

Wavefront sensors

Aspheric lenses

Interferometry

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