Paper
4 January 2008 Experimental study on roughness and flatness of micromirror fabricated by different anisotropic silicon etching processes
Jing Xu, Zhanxi Huang, Xiaoxin Xu, Yaming Wu
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Abstract
Fabrication of flat, free-standing silicon diaphragms as micromirrors using etching processes is the key in the development of optical Micro-Elecro-Mechanical System(MEMS) devices, such as tunable F-P(Fabry-Perot) filters. It is very important for etching process to get smooth surface and uniform depth because they greatly affect the performance of the final device. In this paper, we report the experimental results about roughness and flatness of silicon micromirror fabricated by wet and dry etching processes. The investigated process involved wet-etching process in self-prepared KOH solution, and dry etching process with such machines as ALCATEL 601E DRIE(Deep Reactive Ion Etching) and STS ICP (Inductivity Coupling Plasma). It was found that wet etching process could supply more uniform etching depth, whereas the better surface roughness was gotten by dry etching. For a 30μm target depth, surface roughness less than 3-nm and maximal depth difference less than 0.3-μm were obtained by STS ICP and KOH respectively.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jing Xu, Zhanxi Huang, Xiaoxin Xu, and Yaming Wu "Experimental study on roughness and flatness of micromirror fabricated by different anisotropic silicon etching processes", Proc. SPIE 6836, MEMS/MOEMS Technologies and Applications III, 683605 (4 January 2008); https://doi.org/10.1117/12.768487
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KEYWORDS
Etching

Semiconducting wafers

Silicon

Surface roughness

Micromirrors

Anisotropic etching

Deep reactive ion etching

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