Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses

Ji Min Wen; Tao Zhang

doi:10.1117/12.757336

5 February 2008 Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses

Ji Min Wen, Tao Zhang

Proceedings Volume 6838, Optoelectronic Devices and Integration II; 68380Q (2008) https://doi.org/10.1117/12.757336
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

In this paper, we presents the characterization technique of high-speed optoelectronics devices based electrical and optical spectra, which is as important access to the devices performance as the prevalent vector network analyzer (VNA) sweeping method. The measurement of additional modulation of laser and frequency response of photodetector from electrical spectra, and the estimation of the modulation indexes and the chirp parameters of directly modulated lasers based on optical spectra analysis, are given as examples.

Citation Download Citation

Ji Min Wen and Tao Zhang "Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses", Proc. SPIE 6838, Optoelectronic Devices and Integration II, 68380Q (5 February 2008); https://doi.org/10.1117/12.757336

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