Paper
25 February 2008 Passive cooling effects of low and high fill-factor 937 nm 1 cm arrays
John Hostetler, Ching-Long Jiang, Robert Roff, Viorel Negoita, Stephan Strohmaier, Christoph Tillkorn, Radosveta Radionova, Carl Miester, Thilo Vethake, Ulrich Bonna, Martin Huonker, Christian Schmitz, Friedhelm Dorsch
Author Affiliations +
Abstract
Diode-pumped solid-state lasers are gaining acceptance as the desired laser source for materials processing as well as a host of new applications that are expanding rapidly. Because of this, the performance, stability and lifetime of the diode-pump source face unprecedented scrutiny. Increasing the lifetime of the diode, while increasing power, remains a primary focus of the industry. One lifetime limiting issue is that of a voltage potential in the water cooling channels which can cause cooler degradation and lower efficiency over time. Studies have been carried out that explore different cooling approaches based on passive schemes where insulation layers are present to shield the voltage from the water channels. However, with the introduction of insulation layers, a reduction of the deployable power from that of microchannel coolers is seen. This report explores the effects of passive cooling approaches on the power and divergence of 1 cm AuSn/CuW mounted bars with fill factors ranging from 10% to 50%. It is shown that a 150 W array can be realized on a passive cooler and multiplexed to give a 1600 W stack. Thermal modeling is presented along with life-test data for passively cooled devices.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Hostetler, Ching-Long Jiang, Robert Roff, Viorel Negoita, Stephan Strohmaier, Christoph Tillkorn, Radosveta Radionova, Carl Miester, Thilo Vethake, Ulrich Bonna, Martin Huonker, Christian Schmitz, and Friedhelm Dorsch "Passive cooling effects of low and high fill-factor 937 nm 1 cm arrays", Proc. SPIE 6876, High-Power Diode Laser Technology and Applications VI, 68760A (25 February 2008); https://doi.org/10.1117/12.763443
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KEYWORDS
Data modeling

3D modeling

Diodes

Resistance

Thermal modeling

Curium

Electro optical modeling

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