Pico meter metrology for the GAIA mission

E. A. Meijer; J. N. Nijenhuis D.V.M.; R. J. P. Vink; F. Kamphues

doi:10.1117/12.789339

12 July 2008 Pico meter metrology for the GAIA mission

E. A. Meijer, J. N. Nijenhuis D.V.M., R. J. P. Vink, F. Kamphues

Proceedings Volume 7010, Space Telescopes and Instrumentation 2008: Optical, Infrared, and Millimeter; 70102O (2008) https://doi.org/10.1117/12.789339
Event: SPIE Astronomical Telescopes + Instrumentation, 2008, Marseille, France

Abstract

To measure the relative motions of GAIA's telescopes, the angle between the telescopes is monitored by an all Silicon Carbide Basic Angle Monitoring subsystem (BAM OMA). TNO is developing this metrology system. The stability requirements for this metrology system go into the pico meter and pico radian range. Such accuracies require extreme measures and extreme stability. Specific topics addressed are mountings of opto-mechanical components, gravity deformation, materials and tests that were necessary to prove that the requirements are feasible. Especially mounting glass components on Silicon Carbide and mastering the Silicon Carbide material proved to be a challenge.

Citation Download Citation

E. A. Meijer, J. N. Nijenhuis D.V.M., R. J. P. Vink, and F. Kamphues "Pico meter metrology for the GAIA mission", Proc. SPIE 7010, Space Telescopes and Instrumentation 2008: Optical, Infrared, and Millimeter, 70102O (12 July 2008); https://doi.org/10.1117/12.789339

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