The Application Of Transmission Electron Microscopy To The Study Of Microstructures In Linbo[sub]3[/sub] Optical

W. E. Lee

doi:10.1117/12.937167

10 March 1987 The Application Of Transmission Electron Microscopy To The Study Of Microstructures In Linbo₃ Optical

W. E. Lee

Proceedings Volume 0704, Integrated Optical Circuit Engineering IV; (1987) https://doi.org/10.1117/12.937167
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States

Abstract

The basic principles of Transmission Electron Microscopy are outlined and examples of microstructures observed in LiNbO₃, waveguides reported. Defects present in the waveguides may have significant effects on their waveguiding ability. Various speculative arguments are suggested for the influence of these defects on the waveguide.

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W. E. Lee "The Application Of Transmission Electron Microscopy To The Study Of Microstructures In Linbo₃ Optical", Proc. SPIE 0704, Integrated Optical Circuit Engineering IV, (10 March 1987); https://doi.org/10.1117/12.937167

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