Analysis of silver columnar thin films by atomic force microscopy

Fatima Benkabou; Akhlesh Lakhtakia

doi:10.1117/12.796212

10 September 2008 Analysis of silver columnar thin films by atomic force microscopy

Fatima Benkabou, Akhlesh Lakhtakia

Proceedings Volume 7041, Nanostructured Thin Films; 704112 (2008) https://doi.org/10.1117/12.796212
Event: NanoScience + Engineering, 2008, San Diego, California, United States

Abstract

Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.

Citation Download Citation

Fatima Benkabou and Akhlesh Lakhtakia "Analysis of silver columnar thin films by atomic force microscopy", Proc. SPIE 7041, Nanostructured Thin Films, 704112 (10 September 2008); https://doi.org/10.1117/12.796212

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