Paper
17 November 2008 Axis perpendicularity measuring method using vision
Chang-Woo Lee, Jun-Yeob Song, Tae-Ho Ha
Author Affiliations +
Proceedings Volume 7266, Optomechatronic Technologies 2008; 72661M (2008) https://doi.org/10.1117/12.807264
Event: International Symposium on Optomechatronic Technologies, 2008, San Diego, California, United States
Abstract
Perpendicularity measurement is very important in machine assembly and calibration. Axis perpendicularity error often contributes much more to the total error than the linear positioning and straightness errors. This paper presents two new non-contact methods for measuring axis perpendicularity using vision system. In general a perpendicular master and a dial gauge are used to measure the axis perpendicularity. We can obtain the axis perpendicularity by measuring differences from the master. Therefore, its accuracy depends on the accuracy of perpendicular master. The accuracy of the perpendicular master is therefore extremely important and it is impossible that the accuracy of a perpendicularity measurement is superior to the accuracy of the perpendicular master. This paper proposes two new methods that can measure axis perpendicularity without using a perpendicular master. Absolute axis perpendicularity measurement can be achieved by vision system. The feasibility of our developed measurement methods are confirmed by several experimental results.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chang-Woo Lee, Jun-Yeob Song, and Tae-Ho Ha "Axis perpendicularity measuring method using vision", Proc. SPIE 7266, Optomechatronic Technologies 2008, 72661M (17 November 2008); https://doi.org/10.1117/12.807264
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KEYWORDS
Calibration

CCD cameras

Pixel resolution

Interferometers

Laser systems engineering

Error analysis

Image resolution

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