System study and error analysis of new photoelectricity film test

Tianze Li; Shuyun Wang; Fang Wen; Boxue Tan

doi:10.1117/12.828683

20 May 2009 System study and error analysis of new photoelectricity film test

Tianze Li, Shuyun Wang, Fang Wen, Boxue Tan

Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 72831S (2009) https://doi.org/10.1117/12.828683
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

Firstly theory and characteristics of light passing film are analyzed. Then, a new type of photoelectric film detection system with some components, such as lens, a splitting prism, a filter, a new photoelectric detector, and so on are also analyzed.The system uses a high-precision bridge comparative method to send optical signals shoot by lamp-house to the beamsplitter through an optical system composed with lens. The beamsplitter divides signals into two symmetrical ways respectively passing symmetrical optical systems composed with filters, diaphragms and so on, in which one enters the test film and the other enters referenced film. The test film and the referenced one make different decays for two signals, and then optical signals are transformed into electric signals which are amplified by a low temperature drift amplifier after being compared in high-precision electric bridge. At last the thickness values of film are displayed by displaying circuit. The system has a symmetrical structure and high test precision. We use this system to measure films practically and obtain experiment data results. Then we analyze the error and the results and present several important conclusions.

Citation Download Citation

Tianze Li, Shuyun Wang, Fang Wen, and Boxue Tan "System study and error analysis of new photoelectricity film test", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72831S (20 May 2009); https://doi.org/10.1117/12.828683

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Absorption

Light

Optical filters

Error analysis

Optoelectronics

Stray light

Electronic filtering

Show All Keywords

Keywords/Phrases

Search In:

Publication Years