Paper
27 April 2009 Measurement results for time-delayed source interferometers for windows, hemispherical domes, and tangent ogives
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Abstract
A time-delayed source interferometer manipulates the output of a short-coherence length source so that light reflected from the two surfaces of a nominally constant-thickness optical component interfere. The interference pattern is a measure of optical thickness variation and can be phase-shifted. The approach is well suited to optical components that are nominally constant thickness over some portion of the surface. Interferometers suited to the measurement of windows, hemispherical domes and tangent ogives have been built. Data acquisition, calibration tooling and processing methods are described for the stitching of phase data.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William P. Kuhn, Matthew B. Dubin, Robert S. LeCompte, and Hector P. Durazo "Measurement results for time-delayed source interferometers for windows, hemispherical domes, and tangent ogives", Proc. SPIE 7302, Window and Dome Technologies and Materials XI, 73020R (27 April 2009); https://doi.org/10.1117/12.818386
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Cited by 1 scholarly publication.
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KEYWORDS
Interferometers

Domes

Wavefronts

Calibration

Data acquisition

Cameras

Objectives

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