Design and test results of a readout circuit for high energy particle detectors

Mingming Zhang; Zhongjian Chen; Yacong Zhang; Wengao Lu; Huiyao An; Lijiu Ji

doi:10.1117/12.836618

4 August 2009 Design and test results of a readout circuit for high energy particle detectors

Mingming Zhang, Zhongjian Chen, Yacong Zhang, Wengao Lu, Huiyao An, Lijiu Ji

Proceedings Volume 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications; 73851N (2009) https://doi.org/10.1117/12.836618
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

A readout integrated circuit for high energy particle detectors is presented. The circuit designed is composed of a Charge Sensitive Amplifier (CSA), a pulse shaper with four selectable peaking time, and an output stage. The readout circuit has been designed in a 0.35um DPTM CMOS technology and tested with Verigy 93000. The size of readout circuit is 1.7*0.7mm². The power supply voltage is 5V. The average gain is about 20.5mV/fC and the Equivalent Noise Charge (ENC) with detector disconnected is 550-650e for five chips in the typical mode. The power dissipation is about 8mW and 2mW respectively, with and without output buffer. The linearity reaches 99.2% in the typical mode. The gain is tunable from 13mV/fC to 130mV/fC and the peaking time varies from 700ns to 1.6us.

Citation Download Citation

Mingming Zhang, Zhongjian Chen, Yacong Zhang, Wengao Lu, Huiyao An, and Lijiu Ji "Design and test results of a readout circuit for high energy particle detectors", Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851N (4 August 2009); https://doi.org/10.1117/12.836618

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